
掃描式隧道顯微鏡;掃描穿隧顯微鏡
Scanning tunneling microscope (STM) is exploited to characterize morphologies and molecular structures of polyimide Langmuir-Blodgett(LB) monolayers.
掃描隧道顯微鏡(STM)被用來表征聚酰亞胺LB膜的形貌及分子排列結構。
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
掃描隧道顯微鏡(STM)的工作方式是把電壓加到顯微鏡探頭尖端與被掃描物體這兩端,然後檢測電流變化。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope(STM)and has extensive application in polymer field.
原子力顯微鏡( AFM)是在掃描隧道顯微鏡( STM)基礎上發明的又一種納米級高分辨率顯微技術,目前已在高分子領域獲得了廣泛的應用。
The nano dots fabrication tests of Au film and single-crystal silicon were performed in air using scanning tunneling microscope(STM).
研究了大氣狀态下應用掃描隧道顯微鏡( STM)對金薄膜和單晶矽材料進行了納米級電場加工實驗。
Scanning probe microscope (SPM), including atomic force microscope (AFM) and scanning tunneling microscope (STM), is a useful tool in exploring the world of nanotechnology.
作為探索納米世界的利器,以原子力顯微鏡(AFM)和掃描隧道顯微鏡(STM)為代表的掃描探針顯微鏡(SPM)是納米技術發展的重要基礎。
Nanowires have been successfully fabricated by selective oxidation of a H passivated Si(110) surface with an ambient scanning tunneling microscope.
利用掃描隧道顯微鏡對氫鈍化的矽表面進行選擇性氧化,形成了納米尺度的線條。
Since the development of Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM) in 1980s, nanometer technology has brought great change to people's production and life.
二十世紀八十年代以來,隨着掃描隧道顯微鏡(STM)和原子力顯微鏡(AFM)相繼問世,納米科技正給人類的生産生活帶來深刻變革。
Reviewed are the basic principles and application fields of probe-based imaging microscope, represented by scanning tunneling microscopes for the recent 20 years.
綜述了近二十年來以掃描隧道顯微鏡為代表的、基于探針的成像顯微裝置基本原理及應用領域。
He also said his team used for production of metal only the needs of the scanning tunneling microscope images.
他還說他的小組選用金屬隻是出于制作掃描隧道顯微鏡圖片的需要。
To make the breakthrough, a team of physicists at IBM Research Zurich in Switzerland and the University of Liverpool in the United Kingdom used a device called a scanning tunneling microscope (STM).
為了取得突破,一組物理學家們在瑞士的蘇黎世的IBM實驗室和英國的利物浦大學使用了一個名為掃描隧道顯微鏡(STM)的裝置。
Our home made scanning tunneling microscope(STM) is utilized to study the nanolithography of graphite surface.
利用自制的掃描隧道顯微鏡(STM ) ,進行了石墨表面的納米級加工研究。
The scanning tunneling microscope (STM) is our prime instrument to study the above mentioned topics.
我們的主要研究儀器為掃描穿隧顯微鏡(STM)。
Analyzing surface appearance and interface with scanning tunneling microscope (STM) and atom forces microscope (AFM).
使用掃描隧道顯微鏡(STM)、原子力顯微鏡(AFM)觀察了薄膜的表面形貌。
Quantum tunneling is also a key feature of the scanning tunneling microscope, the first machine to enable the imaging and manipulation of individual atoms.
量子隧穿還是掃描隧道電子顯微鏡的一大特色。這是第一種能夠拍攝和操作原子的顯微鏡。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
介紹了掃描隧道顯微鏡(STM)和原子力顯微鏡(AFM)的原理和目前情況。
The aim and importance, the teaching content, the teaching method and the good effect about the scanning tunneling microscope(STM) experiment were introduced.
介紹了在大學本科生中開設掃描隧道顯微鏡(STM)實驗課的目的意義、教學内容、教學方法和嘗試取得的良好效果。
When voltage pulses were applied between the TEA(TCNQ) 2 sample and the tip of a scanning tunneling microscope(STM), an array of holes, nanometer in diameter, could be produced on its surface.
在掃描隧道顯微鏡(STM)針尖和TEA(TCNQ)2樣品間加電壓脈沖,可以在TEA(TCNQ)2樣品表面形成規則排列的直徑為納米級孔洞陣列。
The total internal reflection and the system of photon scanning tunneling microscope (PSTM) are simulated using finite difference time domain (FDTD) method.
采用時域有限差分方法計算全内反射和光子掃描隧道顯微鏡系統。
In order to improve the response rate and positioning accuracy of micro actuator of scanning tunneling microscope, a new control scheme which is based on the self-adaptive is proposed.
為提高掃描隧道顯微鏡微驅動器的響應速度和定位精度,提出了一種基于自適應理論的控制方法。
Nanometer scale conductive patterns have been produced on thin films of electrical bistable organic complexes using the tip of scanning tunneling microscope (STM) with intense electric fields.
用STM針尖對有機絡合物電雙穩薄膜材料施加強電場作用,可在材料表面産生納米線度的導電幾何圖形。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
測量中,把掃描隧道顯微鏡的探針掃描線作為參考栅,把物質原子晶格栅結構作為試件栅,對這兩組栅線幹涉形成的雲紋進行了納米級變形測量。
A dual imaging unit scanning tunneling microscope-atomic force microscope(STM-AFM ) was developed for nanometer order metrology. It consists of a reference STMunit and a test AFM unit.
研制了用于納米計量的雙成象單元掃描隧道顯微鏡一原子力顯微鏡,由掃描隧道顯微鏡參考單元和原子力顯微鏡被測單元組合而成。
The results show that the finite difference time domain method is an efficient tool for photon scanning tunneling microscope.
表明時域有限差分方法在光子掃描隧道顯微鏡理論研究中具有很大潛力。
This work is an attempt to investigate the surface microstructure of rayon based carbon fibers (RCF) with the help of scanning tunneling microscope (STM), which is still lacking.
用掃描隧道顯微鏡 (STM)對粘膠基碳纖維 (RCF)表面的微觀結構進行了研究 ,首次獲得了原子級的RCF圖像。
Abstr: Electrochemical corrosion of tungsten wire is a easier controlled tip preparation method for scanning tunneling microscope.
文章摘要:電化學腐蝕法制備鎢針尖是一種較易控制的獲得掃描隧道顯微鏡針尖的方法。
This scanning tunneling microscope image of a bismuth superconducting compound shows a characteristic checkerboard pattern.
掃描隧道顯微鏡 下铋超導化合物的鮮明棋盤圖樣。
Low temperature scanning tunneling microscope;
低溫掃描隧道顯微鏡;InGaAs;
Materials are stu***d and mastered via a project in which students design and fabricate a Scanning Tunneling Microscope (STM).
學生通過在項目中設計和制造掃描隧道顯微鏡來研究和掌握所學資料。
掃描隧道顯微鏡(Scanning Tunneling Microscope,簡稱STM)是一種基于量子隧道效應的高分辨率顯微技術設備,主要用于觀察材料表面的原子級結構和電子态。以下是詳細解釋:
STM由格爾德·賓甯(Gerd Binnig)和海因裡希·羅雷爾(Heinrich Rohrer)于1982年發明,其核心原理是通過探測針尖與導電樣品表面之間的隧道電流來成像。其分辨率可達橫向0.1納米、縱向0.01納米,是首個能直接觀察單個原子的顯微鏡。
STM的發明推動了納米科技發展,被列為20世紀80年代十大科技成就之一,其發明者因此獲得1986年諾貝爾物理學獎。
如需更完整的原理圖或應用案例,可參考、3、6、8等來源。
掃描隧道顯微鏡(Scanning Tunneling Microscope,簡稱STM)是一種高分辨率的顯微鏡,能夠在原子尺度下觀察物質的表面。以下是有關STM的詳細解釋:
掃描隧道顯微鏡是一種高科技儀器,通常用于研究物質的表面結構。它通過在樣品表面掃描一根極細的針來實現觀測,該針的尖端隻有一個原子的大小,可以感知樣品表面的原子排列和電子狀态。由于其高分辨率和精準性,掃描隧道顯微鏡在材料科學、物理學和化學等領域被廣泛應用。
掃描隧道顯微鏡的工作原理是基于量子力學中的隧道效應。用一根極細的針(掃描探針)掃描樣品表面,當探針尖端與樣品表面非常接近時,由于量子力學中的隧道效應,電子就可以從樣品表面“隧道”到探針尖端,形成一個電流。通過測量這個電路的電流,就可以得到樣品表面的拓撲結構和電子狀态。
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